Transform Your Measurement Solutions with the 7Semi ADS1263 32-bit ADC: Elevate Precision in Every Application!
Enhance your factory automation capabilities with the 7Semi ADS1263 32-bit ADC with PGA Breakout, featuring the highly regarded ADS1262 from Texas Instruments. This advanced analog-to-digital converter offers exceptional low-noise and low-drift performance, making it ideal for demanding sensor applications such as weigh scales, strain-gauge sensors, thermocouples, and resistance temperature devices (RTD). With its integrated programmable gain amplifier (PGA) and voltage reference, this ADC ensures accurate measurements in a compact design, providing a complete one-chip solution for precision measurement tasks.
Designed with flexibility in mind, the 7Semi ADS1263 features an auxiliary 24-bit delta-sigma ADC for background measurements, a single-cycle settling digital filter for efficient multiple-input conversion, and robust fault monitoring capabilities. The ADC operates across a wide range of data rates from 2.5 SPS to 38400 SPS, enabling seamless integration into various applications. With unparalleled accuracy, the ADS1263 delivers high-performance results, making it the perfect choice for professionals seeking reliability and precision in their measurement systems.
Key Features:
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Precision 32-bit ΔΣ ADC: Delivers high-resolution measurements for critical applications.
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Auxiliary 24-bit ΔΣ ADC (ADS1263): Allows for concurrent background measurements without compromising performance.
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Data Rates: Operates efficiently at 2.5 SPS to 38400 SPS to meet diverse application needs.
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Differential Input CMOS PGA: Offers programmable gain from 1 to 32 for tailored measurement solutions.
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11 Multifunction Analog Inputs: Supports multiple sensor configurations for versatile use.
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High-Accuracy Architecture:
- Offset Drift: 1 nV/°C
- Gain Drift: 0.5 ppm/°C
- Noise: 7 nVRMS (2.5 SPS, gain = 32)
- Linearity: 3 ppm
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2.5-V Internal Voltage Reference: Maintains stability with a temperature drift of 2 ppm/°C.
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50-Hz and 60-Hz Rejection: Eliminates line cycle interference for cleaner data.
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Single-Cycle Settled Conversions: Maximizes throughput for high-speed applications.
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Dual Sensor Excitation Current Sources: Ideal for direct RTD measurements.
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Internal Fault Monitors: Ensures operational reliability and safety.
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Internal ADC Test Signal: Facilitates system testing and validation.
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8 General-Purpose Inputs/Outputs: Enhances control and monitoring capabilities.
